KA Imaging is introducing its patented amorphous selenium (a-Se) BrillianSe X-ray detector for high brilliance imaging. The hybrid a-Se/CMOS detector uses an a-Se photoconductor with high intrinsic spatial resolution for direct conversion of X-ray photons to electric charge. The electronic signal is then read out by a low noise CMOS active pixel sensor (APS). Without the need to first convert X-ray photons to visible light, as in indirect scintillator-based approaches, thinning of the conversion layer to minimize optical scatter is not necessary. BrillianSe™ provides a unique combination of high spatial resolution using 8 μm pixels, and high Detective Quantum Efficiency (DQE) for energies up to 110 keV. This combination enables efficient imaging at low flux and high energy, as well as propagation-based (grating less) in-line phase-contrast enhancement for improved sensitivity when imaging low-density materials.
The direct conversion approach allows a thick conversion layer and operation at 100% fill factor high DQE.
This facilitates imaging for low flux applications such as X-ray diffraction, dose sensitive protein crystallography or throughput-limited imaging of materials with and without phase-contrast.
Use the slider to see how phase contrast improves the image quality.:
Amorphous Selenium with CMOS APS
~36% at 10 cycles/mm
Propagation – based
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