inCiTe™ 3D X-ray Microscope

The inCiTe™ 3D X-ray Microscope provides phase contrast imaging and micro-CT capabilities from KA Imaging, and is the first commercial X-ray CT system that utilizes BrillianSe™, a patented high spatial resolution amorphous selenium (a-Se) detector technology exclusively developed by KA Imaging.


High spatial resolution and detection efficiency of BrillianSe™ X-ray detector enables rapid phase contrast imaging and conventional micro-CT in a convenient benchtop system.


Fields that can benefit from this technology include non-destructive testing (NDT), additive manufacturing, electronics, agriculture, geology, preclinical imaging, and specimen radiography.

Exclusive amorphous selenium (a-Se) detector 

A unique combination of high spatial resolution and detection efficiency


Phase contrast technology 

Phase contrast technology for superior contrast 


Better visualization of low-density materials 

Excellent visualization of biomaterials, polymer composites and other low-density materials 


Patented technology  

Learn how our technology works.


We’re looking for clinical and enterprise partners as we expand. Contact Us to receive more details.

Use the slider to see how phase contrast improves the image quality:


X-ray Detector

16MP CMOS Detector, 8μm pitch, 14 bit resolution

Spatial Resolution

11 μm ( 0.5 MTF at 45 cycles/mm) 5.6 μm ( 0.1 MTF at 90 cycles/mm)

X-ray Source

40-110 KV, 16 W, 2 μm spot size

X-ray Phase-Contrast

Propagation – based

Media Gallery


Science center

Related content

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Introducing InCiTe™ micro-CT and BrillianSe™ X-ray Camera to Asian markets    Waterloo, Ont. (June 28, 2021) – KA Imaging has announced an international distribution agreement with Beijing-based Top-Unistar Science and Technology Co., LTD, China for patented technologies aimed at the scientific field: the BrillianSe™ X-ray camera, and the inCiTe™ phase-contrast benchtop micro-CT system.   BrillianSe™ is an X-ray camera that uses a patented amorphous selenium......

Amorphous Selenium/CMOS Technology Can Address the Shortfalls of Other Detectors  Waterloo, Ont. (June 24, 2021)  Dr. Christopher C. Scott published a new paper to the Journal of Synchrotron Radiation titled “High-energy Micrometre-scale Pixel Direct Conversion X-ray Detector,” which is available to subscribers now.   The abstract explains......

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